翻訳と辞書 Words near each other ・ Thermal history coating ・ Thermal history modelling ・ Thermal history of the Earth ・ Thermal hydraulics ・ Thermal hydrolysis ・ Thermal imaging camera (firefighting) ・ Thermal immersion circulator ・ Thermal infrared spectroscopy ・ Thermal insulation ・ Thermal integrity profiling ・ Thermal ionization ・ Thermal ionization mass spectrometry ・ Thermal keratosis ・ Thermal lag ・ Thermal lance ・ Thermal laser stimulation ・ Thermal loop ・ Thermal low ・ Thermal management ・ Thermal management of electronic devices and systems ・ Thermal management of high-power LEDs ・ Thermal manikin ・ Thermal mass ・ Thermal mass flow meter ・ Thermal mass refrigerator ・ Thermal Micrometeoroid Garment ・ Thermal neutral zone ・ Thermal optimum ・ Thermal oxidation ・ Thermal Oxide Reprocessing Plant Dictionary Lists mini英和辞書 mini和英辞書 Webster 1913 Latin-English FOLDOC Wikipedia English ウィキペディア

翻訳と辞書　辞書検索 [ 開発暫定版 ] スポンサード リンク Thermal laser stimulation ： ウィキペディア英語版 Thermal laser stimulation Thermal laser stimulation represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. This technique may be used for semiconductor failure analysis. There are four techniques associated with thermal laser stimulation: optical beam induced resistance change (OBIRCH), thermally induced voltage alteration (TIVA)), external induced voltage alteration (XIVA) and Seebeck effect imaging (SEI) ==Optical beam induced resistance change== Optical beam induced resistance change (OBIRCH) is an imaging technique which uses a laser beam to induce a thermal change in the device. Laser stimulation highlights differences in thermal characteristics between areas containing defects and areas which are defect-free. As the laser locally heats a defective area on a metal line which is carrying a current, the resulting resistance changes can be detected by monitoring the input current to the device. OBIRCH is useful for detecting electromigration effects resulting in open metal lines. A constant voltage is applied to the device-under-test (DUT). An area of interest is selected on the device, and a laser beam is used to scan the area. The input current being drawn by the device is monitored for changes during this process. When a change in current is noted, the position of the laser at the time that the change occurred is marked on the image of the device. When the laser beam strikes a location which does not contain a void, good thermal transmission exists and the change in electrical resistance is small. In areas containing voids, however, thermal transmission is impeded, resulting in a larger change in resistance. The degree of resistance change is displayed visually on an image of the device, with areas of higher resistance being displayed as bright spots. 抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』 ■ウィキペディアで「Thermal laser stimulation」の詳細全文を読む スポンサード リンク 翻訳と辞書 : 翻訳のためのインターネットリソース Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.